Online Monitoring of MOS Junction Temperature in Power Cycle Test

DOI

10.2991/wcnme-19.2019.28How to use a DOI?

Keywords

power cycle test; junction temperature; online

Abstract

The power cycle test is an important method to test the reliability of the device and eliminate unqualified samples. It is significance to measure various performance of the device. However, the junction temperature of the device changes greatly during the power cycle. Inappropriate high power cycle and duty cycle will make the junction temperature of the device too high, which can directly affect the experimental results and bring about economic losses. Therefore, this paper proposes an online monitoring method of MOS junction temperature during power cycle process, which can effectively prevent the device junction temperature from being too high and at the same time provide an objective basis for the selection of power cycle and duty cycle.

Copyright

© 2019, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Boyang Jiang
AU  - Chunsheng Guo
AU  - Lin Luo
PY  - 2019/06
DA  - 2019/06
TI  - Online Monitoring of MOS Junction Temperature in Power Cycle Test
BT  - Proceedings of the 2019 International Conference on Wireless Communication, Network and Multimedia Engineering (WCNME 2019)
PB  - Atlantis Press
SP  - 122
EP  - 124
SN  - 2352-538X
UR  - https://doi.org/10.2991/wcnme-19.2019.28
DO  - 10.2991/wcnme-19.2019.28
ID  - Jiang2019/06
ER  -