Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering

The Higher Order Crack Tip Fields for Anti-plane Crack in Power Functionally Graded Piezoelectric Materials

Authors
Yao Dai, Xiao Chong, Jing-wen Pan
Corresponding Author
Yao Dai
Available Online April 2015.
DOI
10.2991/mebe-15.2015.226How to use a DOI?
Keywords
higher order fields; power FGPMs; eigen-expansion method; anti-plane crack
Abstract

The eigen-solutions of the crack tip fields for an anti-plane crack in functionally graded piezoelectric materials (FGPMs) are studied. Different from previous analyses, all material properties of the FGPM are assumed to be power-law function of y perpendicular to the crack. The crack surfaces are electrically impermeable and loaded by anti-plane shear tractions and in-plane electric displacements. The higher order crack tip fields of FGPMs are obtained by the eigen-expansion method. The stress intensity factor and electric displacement intensity factor are obtained explicitly.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
978-94-62520-57-8
ISSN
2352-5401
DOI
10.2991/mebe-15.2015.226How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yao Dai
AU  - Xiao Chong
AU  - Jing-wen Pan
PY  - 2015/04
DA  - 2015/04
TI  - The Higher Order Crack Tip Fields for Anti-plane Crack in Power Functionally Graded Piezoelectric Materials
BT  - Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering
PB  - Atlantis Press
SP  - 1011
EP  - 1014
SN  - 2352-5401
UR  - https://doi.org/10.2991/mebe-15.2015.226
DO  - 10.2991/mebe-15.2015.226
ID  - Dai2015/04
ER  -