Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering

The Crack Tip Fields for Anti-plane Crack in Functionally Graded Piezoelectric Materials with Arbitrarily Gradient Direction

Authors
Yao Dai, Xiao Chong, Wei-hai Sun
Corresponding Author
Yao Dai
Available Online April 2015.
DOI
10.2991/mebe-15.2015.225How to use a DOI?
Keywords
crack tip fields; FGPMs; eigen-expansion method; anti-plane crack
Abstract

The higher order crack tip fields for anti-plane crack in functionally graded piezoelectric materials(FGPMs) under mechanical and electrical loadings are investigated. Although the elastic stiffness, piezoelectric parameter, and dielectric permittivity of FGPMs are assumed to be exponential functions they are along arbitrary gradient direction. As usual, the crack surfaces are assumed to be electrically impermeable. Similar to the Williams’ solution of homogeneous elastic materials, the high order crack tip stress and electric displacement fields are obtained by the method of eigen-expansion.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering
Series
Advances in Engineering Research
Publication Date
April 2015
ISBN
978-94-62520-57-8
ISSN
2352-5401
DOI
10.2991/mebe-15.2015.225How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yao Dai
AU  - Xiao Chong
AU  - Wei-hai Sun
PY  - 2015/04
DA  - 2015/04
TI  - The Crack Tip Fields for Anti-plane Crack in Functionally Graded Piezoelectric Materials with Arbitrarily Gradient Direction
BT  - Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering
PB  - Atlantis Press
SP  - 1007
EP  - 1010
SN  - 2352-5401
UR  - https://doi.org/10.2991/mebe-15.2015.225
DO  - 10.2991/mebe-15.2015.225
ID  - Dai2015/04
ER  -