Research on Performance Test of Metering Chip
Authors
H. L. Sun, K. J. Zhou, H. F. Luo
Corresponding Author
H. L. Sun
Available Online November 2015.
- DOI
- 10.2991/itms-15.2015.216How to use a DOI?
- Keywords
- Metering chip; Testing platform; Dynamic range; Reliability; Security
- Abstract
For testing metering chip’s function and performance, this paper has build a testing platform and done a lot of research, including testing dynamic range methods, reliability and security of metering chip. The error caused by other components is eliminated in this paper in this platform, comparing with traditional meter testing method. The testing platform can load various packages chips from various brands, and be able to not only evaluate performance of metering chips from different manufacturers, but also apply to function and performance test on bulk chips. In additional, a testing result of single phase metering chip V9281 is provided.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - H. L. Sun AU - K. J. Zhou AU - H. F. Luo PY - 2015/11 DA - 2015/11 TI - Research on Performance Test of Metering Chip BT - Proceedings of the 2015 International Conference on Industrial Technology and Management Science PB - Atlantis Press SP - 901 EP - 905 SN - 2352-538X UR - https://doi.org/10.2991/itms-15.2015.216 DO - 10.2991/itms-15.2015.216 ID - Sun2015/11 ER -