Proceedings of the 2015 International Conference on Industrial Technology and Management Science

Research on Performance Test of Metering Chip

Authors
H. L. Sun, K. J. Zhou, H. F. Luo
Corresponding Author
H. L. Sun
Available Online November 2015.
DOI
10.2991/itms-15.2015.216How to use a DOI?
Keywords
Metering chip; Testing platform; Dynamic range; Reliability; Security
Abstract

For testing metering chip’s function and performance, this paper has build a testing platform and done a lot of research, including testing dynamic range methods, reliability and security of metering chip. The error caused by other components is eliminated in this paper in this platform, comparing with traditional meter testing method. The testing platform can load various packages chips from various brands, and be able to not only evaluate performance of metering chips from different manufacturers, but also apply to function and performance test on bulk chips. In additional, a testing result of single phase metering chip V9281 is provided.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2015 International Conference on Industrial Technology and Management Science
Series
Advances in Computer Science Research
Publication Date
November 2015
ISBN
978-94-6252-123-0
ISSN
2352-538X
DOI
10.2991/itms-15.2015.216How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - H. L. Sun
AU  - K. J. Zhou
AU  - H. F. Luo
PY  - 2015/11
DA  - 2015/11
TI  - Research on Performance Test of Metering Chip
BT  - Proceedings of the 2015 International Conference on Industrial Technology and Management Science
PB  - Atlantis Press
SP  - 901
EP  - 905
SN  - 2352-538X
UR  - https://doi.org/10.2991/itms-15.2015.216
DO  - 10.2991/itms-15.2015.216
ID  - Sun2015/11
ER  -