Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering

Reconstruction of high-resolution Depth Map using Sparse Linear Model

Authors
Hanqi Fan, Dexing Kong, Jinhong Li
Corresponding Author
Hanqi Fan
Available Online April 2015.
DOI
10.2991/isrme-15.2015.65How to use a DOI?
Keywords
Depth Image; Sparse Representation
Abstract

In this paper, we propose a method that constructs a high-resolution depth image with high quality from a low-resolution depth image that is noisy and contains holes. We believe that the high-resolution depth map is generated by sparse linear combination of atoms from an over-complete dictionary, and the low-resolution depth map are the samples from the high-resolution depth map. Under Bayesian framework, we find the optimal sparse coefficient vector that represents the high-resolution map best. Comprehensive quantitative comparisons show that our method outperforms existing approaches when applied on Middlebury dataset, and qualitative comparison on real scenes indicates that our algorithm performs best.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
Series
Advances in Intelligent Systems Research
Publication Date
April 2015
ISBN
978-94-62520-59-2
ISSN
1951-6851
DOI
10.2991/isrme-15.2015.65How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hanqi Fan
AU  - Dexing Kong
AU  - Jinhong Li
PY  - 2015/04
DA  - 2015/04
TI  - Reconstruction of high-resolution Depth Map using Sparse Linear Model
BT  - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering
PB  - Atlantis Press
SP  - 283
EP  - 292
SN  - 1951-6851
UR  - https://doi.org/10.2991/isrme-15.2015.65
DO  - 10.2991/isrme-15.2015.65
ID  - Fan2015/04
ER  -