Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

Reliability Analysis of Multi-Node SDDC Using Fault Tree

Authors
Yaping Wan, Chenhui Luo, Zhiming Liu
Corresponding Author
Yaping Wan
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.256How to use a DOI?
Keywords
Fault Tree; Cloud Computing; Reliability; SDDC
Abstract

The software-defined data center (SDDC), while well understood architecturally, is beginning to reveal some of its benefits beyond agility, speed, and efficiency as organizations deploy and discover other areas of improvement. One critical area which we warmly discussed is reliability. The inaccessible of data and unavailability of computing resources can be frequent, so businesses use many protection techniques to guard against failures. Evaluations of the SDDC reliability have focused mainly on deploying multi-node for the clouding infrastructure which can bear the same works. We use comprehensive failure tree theory to evaluate the reliability and the performance of multi-node cloud computing system. The results show under specific system conditions with maximum functional nodes on the SDDC system, cloud impact on system reliability is nearly larger than the single node of application type.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
978-94-62520-54-7
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.256How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yaping Wan
AU  - Chenhui Luo
AU  - Zhiming Liu
PY  - 2015/03
DA  - 2015/03
TI  - Reliability Analysis of Multi-Node SDDC Using Fault Tree
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 1155
EP  - 1158
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.256
DO  - 10.2991/iiicec-15.2015.256
ID  - Wan2015/03
ER  -