Proceedings of the 2015 International Conference on Electrical, Electronics and Mechatronics

Transmission Line Traveling Wave Fault Location Based on Empirical Mode Decomposition De-noising

Authors
Shan Hong, Baohua Wang, Xiaodong Liu
Corresponding Author
Shan Hong
Available Online December 2015.
DOI
10.2991/iceem-15.2015.8How to use a DOI?
Keywords
empirical mode decomposition; threshold de-noising; traveling wave fault location; wavelet analysis
Abstract

Wavelet analysis and detection of modulus maximum are usually used to extract fault wave head. But for the actual transmission line, the existence of noise will affect the accurate extraction of wave head, leading to failure of location. To avoid the serious distortion caused by directly removing high frequency components of signal, a new de-noising method based on empirical mode decomposition is proposed. The actual recorded data of a transformer substation were analyzed with matlab. The results of wavelet analysis to noise signal and de-noised signal are compared to verify the feasibility and practicability of this method.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Electronics and Mechatronics
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
978-94-6252-143-8
ISSN
2352-5401
DOI
10.2991/iceem-15.2015.8How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Shan Hong
AU  - Baohua Wang
AU  - Xiaodong Liu
PY  - 2015/12
DA  - 2015/12
TI  - Transmission Line Traveling Wave Fault Location Based on Empirical Mode Decomposition De-noising
BT  - Proceedings of the 2015 International Conference on Electrical, Electronics and Mechatronics
PB  - Atlantis Press
SP  - 30
EP  - 33
SN  - 2352-5401
UR  - https://doi.org/10.2991/iceem-15.2015.8
DO  - 10.2991/iceem-15.2015.8
ID  - Hong2015/12
ER  -