Proceedings of the 4th International Conference on Culture, Education and Economic Development of Modern Society (ICCESE 2020)

Research on the Causes of the Social System of Contemporary Technology Risk

Authors
Yuan-jun Shen
Corresponding Author
Yuan-jun Shen
Available Online 19 March 2020.
DOI
10.2991/assehr.k.200316.106How to use a DOI?
Keywords
technical risk, government system, technical expert system, media system, public
Abstract

From the perspective of the social system, the negative impact of technological risks caused by the misconduct of risk subjects represented by government management agencies, technical experts, the public and the media has rapidly spread beyond technology itself, and the risks of each risk subject Anomie is an important factor in the risk of contemporary technology. In the face of many problems facing contemporary technological risks, research on the causes of the social system of technological risks will help to find a way to avoid technological risks.

Copyright
© 2020, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 4th International Conference on Culture, Education and Economic Development of Modern Society (ICCESE 2020)
Series
Advances in Social Science, Education and Humanities Research
Publication Date
19 March 2020
ISBN
978-94-6252-931-1
ISSN
2352-5398
DOI
10.2991/assehr.k.200316.106How to use a DOI?
Copyright
© 2020, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yuan-jun Shen
PY  - 2020
DA  - 2020/03/19
TI  - Research on the Causes of the Social System of Contemporary Technology Risk
BT  - Proceedings of the 4th International Conference on Culture, Education and Economic Development of Modern Society (ICCESE 2020)
PB  - Atlantis Press
SP  - 476
EP  - 482
SN  - 2352-5398
UR  - https://doi.org/10.2991/assehr.k.200316.106
DO  - 10.2991/assehr.k.200316.106
ID  - Shen2020
ER  -