Impact of NBTI Recovery, Measurement System and Testing Time on NBTI Lifetime Estimation

DOI

10.2991/icamia-15.2015.6How to use a DOI?

Keywords

NBTI; recovery; reliability; device lifetime

Abstract

The effect of recovery on Negative Bias Temperature Instability (NBTI) measurements had always been a challenge for reliability lifetime estimations. Currently various methods had been developed to suppress this characteristic but being able to completely remove it had been to no avail. This paper will first demonstrate the degree of impact of recovery on NBTI measurements; and then moving on to the influence of measurement system as well as testing time on NBTI lifetime estimation.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Vincent King Soon WONG
AU  - Hong Seng NG
AU  - Poh Ching Sim
PY  - 2015/12
DA  - 2015/12
TI  - Impact of NBTI Recovery, Measurement System and Testing Time on NBTI Lifetime Estimation
BT  - Proceedings of the 2015 International Conference on Advanced Manufacturing and Industrial Application
PB  - Atlantis Press
SP  - 23
EP  - 25
SN  - 2352-5401
UR  - https://doi.org/10.2991/icamia-15.2015.6
DO  - 10.2991/icamia-15.2015.6
ID  - WONG2015/12
ER  -