Research on Rapid Analysis for Purity of SF6 via Ion Mobility Spectrometry

DOI

10.2991/icadme-15.2015.388How to use a DOI?

Keywords

SF6, purity analysis, ion mobility spectrometry, time of flight mass spectrometry.

Abstract

The detection of partial discharge and analysis of sulfur hexafluoride (SF6) purity in gas-insulated switchgears (GIS) is important for diagnosis and operating state assessment of the electric device. This paper introduced a method for rapid purity detection of SF6 based on one-way ion mobility spectrometry. The influence of flow rate, temperature and purity of SF6 on the drift time of SF6 were investigated in details. The drift time of SF6 was found to increase with the rising of impurity in SF6. A time of flight mass spectrometer was used for monitoring of decomposition products in SF6 from partial discharge. SO2, SOF2, SO2F2, SOF4 and SiF4 were found to the main discharging decomposition products, which lead to the decrease of purity of SF6.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Liping Zhu
AU  - Bin Tang
AU  - Chenyao Liu
AU  - Yunguang Huang
PY  - 2015/10
DA  - 2015/10
TI  - Research on Rapid Analysis for Purity of SF6 via Ion Mobility Spectrometry
BT  - Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering
PB  - Atlantis Press
SP  - 2081
EP  - 2086
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-15.2015.388
DO  - 10.2991/icadme-15.2015.388
ID  - Zhu2015/10
ER  -