Proceedings of the 3rd International Conference on Electric and Electronics

Study of a New Approach about Locating Single-phase-to-ground Fault

Authors
Bing Jiang, Chuan Zang, Zhiguo Xiao, Jie Yin
Corresponding Author
Bing Jiang
Available Online December 2013.
DOI
10.2991/eeic-13.2013.83How to use a DOI?
Keywords
single phase grounding fault; wavelet transformation; optimized back-propagation network; genetic algorithm; fault location;
Abstract

First this paper briefly analyzes the electric power transient signal of single phase grounding fault, and then the fault characteristics of zero sequence current and bus voltage is obtained by wavelet transformation. Finally by using genetic algorithm to optimize the original weights of back-propagation neural network, as well as taking the fault characteristics as the input characteristic vector of optimized back propagation neural network, the network is trained and tested. The simulation result shows that the prediction effects and convergence rate of optimized back-propagation network have better performance than traditional back-propagation network. It’s relatively error were less than 3%, independent of fault distance, power supply phase angle and the impact of transient resistance.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd International Conference on Electric and Electronics
Series
Advances in Intelligent Systems Research
Publication Date
December 2013
ISBN
978-90786-77-92-5
ISSN
1951-6851
DOI
10.2991/eeic-13.2013.83How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Bing Jiang
AU  - Chuan Zang
AU  - Zhiguo Xiao
AU  - Jie Yin
PY  - 2013/12
DA  - 2013/12
TI  - Study of a New Approach about Locating Single-phase-to-ground Fault
BT  - Proceedings of the 3rd International Conference on Electric and Electronics
PB  - Atlantis Press
SP  - 355
EP  - 359
SN  - 1951-6851
UR  - https://doi.org/10.2991/eeic-13.2013.83
DO  - 10.2991/eeic-13.2013.83
ID  - Jiang2013/12
ER  -