Proceedings of the 2015 International Conference on Electrical, Automation and Mechanical Engineering

Realizing Robustness Testing Based on TTCN-3

Authors
X.M. Liu, Y.P. Liu, S.M. Liu, J. Wu
Corresponding Author
X.M. Liu
Available Online July 2015.
DOI
10.2991/eame-15.2015.122How to use a DOI?
Keywords
robustness testing; data variance; TTCN-3;mutation testing
Abstract

Robustness refers to the ability to ensure the software system execute correctly under normal or abnormal conditions in software testing. Robustness testing needs a large number of illegal and effective inputs, which are one of the key researches. The data variance is based on mutation testing, which is a kind of white box testing through destructing the system under test for robustness testing. The variance data is a kind of determining the robustness by applying some interference to the test input to create abnormal data which is then used to the system under test. Because TTCN-3 is used for black box testing, it can get the data rule description from the system under test. The data variance is also used by TTCN-3 testing. Therefore, the automatic generation of robust illegal inputs is realized on the basis of the data variance in this paper.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Automation and Mechanical Engineering
Series
Advances in Engineering Research
Publication Date
July 2015
ISBN
978-94-62520-71-4
ISSN
2352-5401
DOI
10.2991/eame-15.2015.122How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - X.M. Liu
AU  - Y.P. Liu
AU  - S.M. Liu
AU  - J. Wu
PY  - 2015/07
DA  - 2015/07
TI  - Realizing Robustness Testing Based on TTCN-3
BT  - Proceedings of the 2015 International Conference on Electrical, Automation and Mechanical Engineering
PB  - Atlantis Press
SP  - 431
EP  - 434
SN  - 2352-5401
UR  - https://doi.org/10.2991/eame-15.2015.122
DO  - 10.2991/eame-15.2015.122
ID  - Liu2015/07
ER  -