Analysis and Application of Infrared Phase Image

DOI

10.2991/caai-17.2017.122How to use a DOI?

Keywords

image processing; phase difference; thermal wave image processing; defect recognition

Abstract

Infrared sequence image processing is widely used in engineering, but the research of infrared phase processing is rare. In this paper, a method of generating thermal wave phase image based on infrared phase locked-in, phase difference processing and its application in coatings defect detection and recognition are presented. The experimental results show that the method is effective and practical.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Jinyu Zhang
PY  - 2017/06
DA  - 2017/06
TI  - Analysis and Application of Infrared Phase Image
BT  - Proceedings of the 2017 2nd International Conference on Control, Automation and Artificial Intelligence (CAAI 2017)
PB  - Atlantis Press
SP  - 545
EP  - 548
SN  - 1951-6851
UR  - https://doi.org/10.2991/caai-17.2017.122
DO  - 10.2991/caai-17.2017.122
ID  - Zhang2017/06
ER  -