Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering

Benchmark Testing for Transwarp Inceptor—A big data analysis system based on in-memory computing

Authors
Chen Mingang, Liu Zhenqiang, Liu Wanggen
Corresponding Author
Chen Mingang
Available Online December 2015.
DOI
10.2991/nceece-15.2016.57How to use a DOI?
Keywords
Benchmark testing; Transwarp Inceptor; Big data
Abstract

The high demand for data analysis and rapid development of big data technology and application has led to a variety of commercial and open source big data processing systems launched by industry and academia. So how to test and evaluate these systems objectively has become an important research topic. In this paper, we propose and develop an automated benchmark testing solution based on TPC-DS for Transwarp Inceptor, a big data analysis system. Test includes generating and loading a 500 GB data set and creating 24 tables and testing the performance of the system and SQL compatibility by executing 99 standard SQL queries. The test results can provide reference for enterprises to compare and choose big data analysis systems.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
Series
Advances in Engineering Research
Publication Date
December 2015
ISBN
978-94-6252-150-6
ISSN
2352-5401
DOI
10.2991/nceece-15.2016.57How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Chen Mingang
AU  - Liu Zhenqiang
AU  - Liu Wanggen
PY  - 2015/12
DA  - 2015/12
TI  - Benchmark Testing for Transwarp Inceptor—A big data analysis system based on in-memory computing
BT  - Proceedings of the 2015 4th National Conference on Electrical, Electronics and Computer Engineering
PB  - Atlantis Press
SP  - 279
EP  - 283
SN  - 2352-5401
UR  - https://doi.org/10.2991/nceece-15.2016.57
DO  - 10.2991/nceece-15.2016.57
ID  - Mingang2015/12
ER  -