Next Article In Volume>
Preparation of Graphene Nanopore based on AFM
Authors
Siyuan Wei, Zhongxin Qi, Tongyu Ji
Corresponding Author
Siyuan Wei
Available Online May 2017.
- DOI
- 10.2991/msmee-17.2017.1How to use a DOI?
- Keywords
- Atomic force microscopy, EFM, LFM, TRM
- Abstract
With the development of science and technology, graphene as a material has arrested increasing attention from scientists, and there are more experiments and researches on its application. The project is focused on the imaging technology of atomic force microscopy, which manages to conduct the image analysis of nanoscale materials such as graphene. It will also promote the understanding of various imaging techniques based on the atomic force imaging technology.
- Copyright
- © 2017, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Next Article In Volume>
Cite this article
TY - CONF AU - Siyuan Wei AU - Zhongxin Qi AU - Tongyu Ji PY - 2017/05 DA - 2017/05 TI - Preparation of Graphene Nanopore based on AFM BT - Proceedings of the 2017 2nd International Conference on Materials Science, Machinery and Energy Engineering (MSMEE 2017) PB - Atlantis Press SP - 1 EP - 4 SN - 2352-5401 UR - https://doi.org/10.2991/msmee-17.2017.1 DO - 10.2991/msmee-17.2017.1 ID - Wei2017/05 ER -