Critical Behaviors and Polarizations in A Transverse Ising Film

DOI

10.2991/meic-14.2014.345How to use a DOI?

Keywords

Ferroelectric thin film; Transverse Ising model; Phase diagram; Curie temperature; Polarization;

Abstract

Ferroelectric thin films described by the transverse field Ising model have been studied by using the usual mean-field approximation. The critical behaviors (the critical surface transverse field and Curie temperature) and polarizations in a transverse Ising film with multi-surface layers are calculated. The main emphasis of our work is laid on the effect of surface exchange interaction on the critical surface transverse field and Curie temperature as a function of the number of surface layers. At the same time, the dependence of polarization on the Curie temperature for the ferroelectric thin film with a certain layers is also discussed in detail.

Copyright

© 2014, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Zhao-Xin Lu
PY  - 2014/11
DA  - 2014/11
TI  - Critical Behaviors and Polarizations in A Transverse Ising Film
BT  - Proceedings of the 2014 International Conference on Mechatronics, Electronic, Industrial and Control Engineering
PB  - Atlantis Press
SP  - 1531
EP  - 1534
SN  - 2352-5401
UR  - https://doi.org/10.2991/meic-14.2014.345
DO  - 10.2991/meic-14.2014.345
ID  - Lu2014/11
ER  -