Proceedings of the 2018 International Conference on Mechanical, Electrical, Electronic Engineering & Science (MEEES 2018)

Research of the Low-voltage Warning Based on Statistical Inference

Authors
Sheng Liu
Corresponding Author
Sheng Liu
Available Online May 2018.
DOI
10.2991/meees-18.2018.13How to use a DOI?
Keywords
low-voltage discrimination; warning; urgent index.
Abstract

In this paper, we refer the discriminate model of low-voltage and urgencies index as an important research content. Formulate the distribution function and calculate the probability of occurrence of each interval by analyzing the data distribution of the low-voltage. Urgencies indicators are set based on the probability, to mention reference for the staff of the grid and improve the work efficiency of the power grid. In addition, the paper also studies the voltage fluctuations, and designs the formula of voltage fluctuations rate, which severs as a parameter to calculate the urgency index, to enhance the actual role of the urgencies index. The empirical results show the effectiveness and high precision of the discriminate model and we can promote the use of it.

Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2018 International Conference on Mechanical, Electrical, Electronic Engineering & Science (MEEES 2018)
Series
Advances in Engineering Research
Publication Date
May 2018
ISBN
978-94-6252-534-4
ISSN
2352-5401
DOI
10.2991/meees-18.2018.13How to use a DOI?
Copyright
© 2018, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Sheng Liu
PY  - 2018/05
DA  - 2018/05
TI  - Research of the Low-voltage Warning Based on Statistical Inference
BT  - Proceedings of the 2018 International Conference on Mechanical, Electrical, Electronic Engineering & Science (MEEES 2018)
PB  - Atlantis Press
SP  - 65
EP  - 69
SN  - 2352-5401
UR  - https://doi.org/10.2991/meees-18.2018.13
DO  - 10.2991/meees-18.2018.13
ID  - Liu2018/05
ER  -