Die to Package Interconnection Materials and Technologies
Authors
Xiaoming Hu
Corresponding Author
Xiaoming Hu
Available Online April 2015.
- DOI
- 10.2991/mebe-15.2015.124How to use a DOI?
- Keywords
- Interconnection technology; flip chip; through-silicon via(TSV); interconnection materials
- Abstract
This article introduced the technologies of die to package .these mainly including wire bonding(WB),tape-automated bonding(TAB),and flip chip(FC).the most common wire bonding technique is ball bonding. This is the foundation of the others .at the end parts, the paper illustrated the new interconnection technology –TSV, it bring us from 2D to 3D interconnection times.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xiaoming Hu PY - 2015/04 DA - 2015/04 TI - Die to Package Interconnection Materials and Technologies BT - Proceedings of the 2015 International Conference on Materials, Environmental and Biological Engineering PB - Atlantis Press SP - 538 EP - 544 SN - 2352-5401 UR - https://doi.org/10.2991/mebe-15.2015.124 DO - 10.2991/mebe-15.2015.124 ID - Hu2015/04 ER -