Proceedings of the International Conference on Logistics, Engineering, Management and Computer Science

Fault Diagnosis based on Semi-supervised Global LSSVM for Analog Circuit

Authors
Chen Chen, Aihua Zhang
Corresponding Author
Chen Chen
Available Online July 2015.
DOI
10.2991/lemcs-15.2015.334How to use a DOI?
Keywords
Analog circuit; Fault diagnosis; Semi-supervised; LDA; LPP
Abstract

Aiming at the analog circuit performance online evaluation demand of the largest interval principle and underlying geometric structure, two online methods of dimension reduction are proposed for analog circuit performance evaluation from the angle of feature extraction, First, a supervised method of dimension reduction based on Fisher’s Linear Discriminant Analysis (LDA) is presented to increase the classification distance largely. This method is a well-known scheme for feature extraction and dimension reduction. However, the incomplete classification will lead to great influence on performance evaluation accuracy. Based on this, another feature extraction strategy by Locality Preserving Projections (LPP) is proposed. LPP should be seen as an alternative unsupervised approach to Principal Component Analysis (PCA). This method properly obtains a local space that best detects the essential manifold structure. In this paper, the fault diagnosis can be recognized via the Global and Local Preserving based Semi-supervised Support Vector Machine (semi-supervised Global LSSVM). The experiment takes a typical Sallen-key low-pass circuit as diagnosis object. In order to prove the effectiveness of the proposed method in this paper, the traditional fault diagnosis method based on standard support vector machine (SVM) is employed also. The diagnosis speed and accuracy are all proved via numerical simulation.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the International Conference on Logistics, Engineering, Management and Computer Science
Series
Advances in Intelligent Systems Research
Publication Date
July 2015
ISBN
978-94-6252-102-5
ISSN
1951-6851
DOI
10.2991/lemcs-15.2015.334How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Chen Chen
AU  - Aihua Zhang
PY  - 2015/07
DA  - 2015/07
TI  - Fault Diagnosis based on Semi-supervised Global LSSVM for Analog Circuit
BT  - Proceedings of the International Conference on Logistics, Engineering, Management and Computer Science
PB  - Atlantis Press
SP  - 1660
EP  - 1664
SN  - 1951-6851
UR  - https://doi.org/10.2991/lemcs-15.2015.334
DO  - 10.2991/lemcs-15.2015.334
ID  - Chen2015/07
ER  -