Research on monocrystalline silicon defect detection based on wavelet singularity
Authors
Wu Wei, Qiu Zongming, Huang Qiu hong
Corresponding Author
Wu Wei
Available Online December 2015.
- DOI
- 10.2991/jimet-15.2015.115How to use a DOI?
- Keywords
- monocrystalline silicon; defect; wavelet transform; Lipschitz exponent
- Abstract
series,the request is too high.The paper constructs a kind of new series instead of the
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Wu Wei AU - Qiu Zongming AU - Huang Qiu hong PY - 2015/12 DA - 2015/12 TI - Research on monocrystalline silicon defect detection based on wavelet singularity BT - Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference PB - Atlantis Press SP - 609 EP - 619 SN - 2352-538X UR - https://doi.org/10.2991/jimet-15.2015.115 DO - 10.2991/jimet-15.2015.115 ID - Wei2015/12 ER -