Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference

Research on monocrystalline silicon defect detection based on wavelet singularity

Authors
Wu Wei, Qiu Zongming, Huang Qiu hong
Corresponding Author
Wu Wei
Available Online December 2015.
DOI
10.2991/jimet-15.2015.115How to use a DOI?
Keywords
monocrystalline silicon; defect; wavelet transform; Lipschitz exponent
Abstract

series,the request is too high.The paper constructs a kind of new series instead of the

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
Series
Advances in Computer Science Research
Publication Date
December 2015
ISBN
978-94-6252-129-2
ISSN
2352-538X
DOI
10.2991/jimet-15.2015.115How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Wu Wei
AU  - Qiu Zongming
AU  - Huang Qiu hong
PY  - 2015/12
DA  - 2015/12
TI  - Research on monocrystalline silicon defect detection based on wavelet singularity
BT  - Proceedings of the 2015 Joint International Mechanical, Electronic and Information Technology Conference
PB  - Atlantis Press
SP  - 609
EP  - 619
SN  - 2352-538X
UR  - https://doi.org/10.2991/jimet-15.2015.115
DO  - 10.2991/jimet-15.2015.115
ID  - Wei2015/12
ER  -