Research on dark noise features of CMOS image sensor
Authors
Lingxiao Li, Jinho Kim, Guangmang Cui, Zhihai Xu, Huajun Feng, Qi Li, Yueting Chen
Corresponding Author
Lingxiao Li
Available Online April 2015.
- DOI
- 10.2991/isrme-15.2015.444How to use a DOI?
- Keywords
- CMOS image sensor; Dark noise; Time distribution; Spatial distribution
- Abstract
In this paper, the noises of images taken by Cannon40D and CMOS industrial camera are analyzed both in time and space domain without outside illumination. The dark random noise associated with time is very low, which means the system noise is almost uncorrelated with time. However, system noise in the center of the CMOS image sensor is lower than those in the marginal area, which suggests the noise presents a certain spatial distribution. Finally, taking the temperature effect into consideration, we find the relationship between the maximum noise and temperature.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Lingxiao Li AU - Jinho Kim AU - Guangmang Cui AU - Zhihai Xu AU - Huajun Feng AU - Qi Li AU - Yueting Chen PY - 2015/04 DA - 2015/04 TI - Research on dark noise features of CMOS image sensor BT - Proceedings of the 2015 International Conference on Intelligent Systems Research and Mechatronics Engineering PB - Atlantis Press SP - 2144 EP - 2147 SN - 1951-6851 UR - https://doi.org/10.2991/isrme-15.2015.444 DO - 10.2991/isrme-15.2015.444 ID - Li2015/04 ER -