Pump Fluence Dependence of Ultrafast Carrier Dynamics in Bulk ZnSe
Authors
Gaofang Li, Fenghong Chu, Anduo Hu, Liang Xue, Zhenglan Bian, Chengxin Pang, Hong Ma
Corresponding Author
Gaofang Li
Available Online March 2015.
- DOI
- 10.2991/iset-15.2015.49How to use a DOI?
- Keywords
- Bulk ZnSe, Optical-pump terahertz-probe spectroscopy, Carrier dynamics
- Abstract
Ultrafast carrier dynamics of bulk ZnSe is investigated by means of the optical-pump terahertz-probe spectroscopy with pump fluence ranging from 38 to 239 J/cm2 at room temperature. With the laser pulse excitation at 400 nm, the negative transmission of terahertz pulse shows an ultrafast rising followed by a biexponential recovery. The relaxation time of fast decay and slow one is increased with pump fluence. This trend is expected for surface states filling, which may inhibit carrier lifetime.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Gaofang Li AU - Fenghong Chu AU - Anduo Hu AU - Liang Xue AU - Zhenglan Bian AU - Chengxin Pang AU - Hong Ma PY - 2015/03 DA - 2015/03 TI - Pump Fluence Dependence of Ultrafast Carrier Dynamics in Bulk ZnSe BT - Proceedings of the First International Conference on Information Science and Electronic Technology PB - Atlantis Press SP - 195 EP - 197 SN - 2352-538X UR - https://doi.org/10.2991/iset-15.2015.49 DO - 10.2991/iset-15.2015.49 ID - Li2015/03 ER -