2D cross entropy method for image segmentation based on artificial bee colony optimization
- DOI
- 10.2991/isaeece-16.2016.56How to use a DOI?
- Keywords
- image segmentation, two-dimensional cross entropy, artificial bee colony algorithm
- Abstract
A kind of image segmentation method with two-dimensional cross entropy was proposed based on the artificial bee colony algorithm to overcome the large amount of calculation and long computing time. Firstly, the principle of two-dimensional cross entropy threshold segmentation was analyzed. Then, the bionic mechanism and searching optimization process of the artificial bee colony algorithm were analyzed, and the threshold segmentation method of two-dimensional cross entropy combined with artificial bee colony algorithm was proposed. Finally, typical image segmentation experiments by using the proposed method were performed and the results were compared with two-dimensional cross entropy exhaustive segmentation method and two-dimensional entropy segmentation method based on Particle Swarm Optimization (PSO). Experimental results show that the speed of the proposed method is ten times faster than the two-dimensional entropy exhaustive segmentation method respectively. Moreover, the threshold selection accuracy and running speed of the proposed method are both better than the threshold segmentation method of two-dimensional cross entropy based on PSO. Therefore, the image segmentation method of two-dimensional cross entropy based on artificial bee colony algorithm can quickly and efficiently resolve image segmentation problems.
- Copyright
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Xianglan Ye AU - Tianhuang Chen PY - 2016/04 DA - 2016/04 TI - 2D cross entropy method for image segmentation based on artificial bee colony optimization BT - Proceedings of the 2016 International Symposium on Advances in Electrical, Electronics and Computer Engineering PB - Atlantis Press SP - 295 EP - 298 SN - 2352-5401 UR - https://doi.org/10.2991/isaeece-16.2016.56 DO - 10.2991/isaeece-16.2016.56 ID - Ye2016/04 ER -