Reliability Assessment of Satellite Ni-Cd Battery based on the End of Discharge Voltage

DOI

10.2991/ipemec-15.2015.210How to use a DOI?

Keywords

Ni-Cd battery; reliability assessment; performance degradation; pseudo life; random effect regression

Abstract

Ni-Cd battery is the key component of the satellite energy system with the characteristics of long life and high reliability, and few or no failure occurs in its traditional life testing. In this paper, based on the performance degradation modeling method, we establish a dynamic degradation model to capture the evolution of the end of discharge voltage (EODV), which is a function of cycle number and temperature. Two methods are utilized to assess the reliability of Ni-Cd battery. Results show that the random effect regression method obtains a more conservative reliability estimation result that the pseudo life based method does.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Cui-ying Duan
AU  - Guang Jin
AU  - Jing-lun Zhou
AU  - Tian-yu Liu
AU  - Lang Zhang
PY  - 2015/05
DA  - 2015/05
TI  - Reliability Assessment of Satellite Ni-Cd Battery based on the End of Discharge Voltage
BT  - Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference
PB  - Atlantis Press
SP  - 1129
EP  - 1134
SN  - 2352-5401
UR  - https://doi.org/10.2991/ipemec-15.2015.210
DO  - 10.2991/ipemec-15.2015.210
ID  - Duan2015/05
ER  -