Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference

Effects of Modeling Method on Prediction of Electronic Properties of Carbon Nantobues and Silicon Nanotubes

Authors
Shuang Xu, Wu-Gui Jiang, Qiu-Wei Fu, Ren-Zhi Zhong, Min Wei
Corresponding Author
Shuang Xu
Available Online May 2015.
DOI
10.2991/ipemec-15.2015.160How to use a DOI?
Keywords
Armchair DOS HOMO-LUMO Electronic properties DFT
Abstract

Based on the density functional theory (DFT), we predict electronic properties of the non-periodic structure and the periodic structure of carbon nanotubes (CNTs) and silicon nanotubes (SiNTs). In the simulation process, we studied how to increase the length of nanotubes or add H atoms to dangling bond to describe the feasibility of the non-periodic structure. The results show that, for the non-periodic structure of CNTs, compared with only increasing the length of the nanotubes, the simulation result of adding H atoms to dangling bond is better. For the non-periodic structure of SiNTs, the simulation result of increasing the length is more reasonable.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference
Series
Advances in Engineering Research
Publication Date
May 2015
ISBN
978-94-62520-73-8
ISSN
2352-5401
DOI
10.2991/ipemec-15.2015.160How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Shuang Xu
AU  - Wu-Gui Jiang
AU  - Qiu-Wei Fu
AU  - Ren-Zhi Zhong
AU  - Min Wei
PY  - 2015/05
DA  - 2015/05
TI  - Effects of Modeling Method on Prediction of Electronic Properties of Carbon Nantobues and Silicon Nanotubes
BT  - Proceedings of the 2015 International Power, Electronics and Materials Engineering Conference
PB  - Atlantis Press
SP  - 868
EP  - 872
SN  - 2352-5401
UR  - https://doi.org/10.2991/ipemec-15.2015.160
DO  - 10.2991/ipemec-15.2015.160
ID  - Xu2015/05
ER  -