Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference

High Temperature Baking Test System Design and Implementation

Authors
Liang Lu, Hong Ma, Yupeng Hu
Corresponding Author
Liang Lu
Available Online March 2015.
DOI
10.2991/iiicec-15.2015.136How to use a DOI?
Keywords
Bonfire Environment; Baking Test; Auto-tuning PID Regulator
Abstract

To simulate the unexpected bonfire environment during weapon’s life time, a high temperature baking test system is established. It chooses the high-temperature furnaces as heating terminal, develops a heat control instrument and programs the computer monitoring software. Considering the problems of the high temperature control, such as time-variant parameters, nonlinear and large time delay, a auto-tuning PID regulator is established. The heat terminal,monitoring software and auto-tuning PID regulator constitute the baking test system which could simulate bonfire environment with the heating range up to 700 and heating rate up to 200 /min. The experimental verification demonstrates that the results show the system meets the requirements of temperature control and could be used for the unexpected bonfire environment.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
Series
Advances in Computer Science Research
Publication Date
March 2015
ISBN
978-94-62520-54-7
ISSN
2352-538X
DOI
10.2991/iiicec-15.2015.136How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Liang Lu
AU  - Hong Ma
AU  - Yupeng Hu
PY  - 2015/03
DA  - 2015/03
TI  - High Temperature Baking Test System Design and Implementation
BT  - Proceedings of the 2015 International Industrial Informatics and Computer Engineering Conference
PB  - Atlantis Press
SP  - 594
EP  - 599
SN  - 2352-538X
UR  - https://doi.org/10.2991/iiicec-15.2015.136
DO  - 10.2991/iiicec-15.2015.136
ID  - Lu2015/03
ER  -