Bibliometric Analysis Of Patent Literature Based On Nano-technology Classifications
Authors
Ning Ma, ZhengBin Chang
Corresponding Author
Ning Ma
Available Online November 2014.
- DOI
- 10.2991/icss-14.2014.73How to use a DOI?
- Keywords
- nano, technical indicators, statistical analysis, bibliometric.
- Abstract
Using bibliometric method, from the nano patent application distributions, legal status, patent types, technology field distributions, inter-division conditions, etc., this paper does quantitative analysis on the nano patents applied in China in order to have an overview of the nano-technology development from a level.
- Copyright
- © 2014, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Ning Ma AU - ZhengBin Chang PY - 2014/11 DA - 2014/11 TI - Bibliometric Analysis Of Patent Literature Based On Nano-technology Classifications BT - Proceedings of the 2014 International Conference on Social Science PB - Atlantis Press SP - 400 EP - 405 SN - 2352-5398 UR - https://doi.org/10.2991/icss-14.2014.73 DO - 10.2991/icss-14.2014.73 ID - Ma2014/11 ER -