Reliability Calculation of Product Failure Data (Part I: Theory)

DOI

10.2991/icsnce-16.2016.39How to use a DOI?

Keywords

Experience value of median rank; Lognormal distribution; Weibull distribution; Maximum entropy; Reliability

Abstract

The failure data of products are random and discrete, showing obvious uncertainty, which bring great inconvenience for reliability calculation. In this, the experience value of median rank, Weibull distribution, lognormal distribution and maximum entropy probability distribution are proposed to describe the distribution information of product failure data. The model of Weibull distribution includes two and three parameters Weibull distribution, and lognormal distribution includes two parameters and three parameters lognormal distribution. Each calculation model reflects different aspects of the information, whose merits shouldn't be blindly judged, but we can analyze a specific product or a group failure data is suitable for what kind of reliability model.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Xintao Xia
AU  - Zhen Chang
AU  - Yunfei Li
AU  - Bin Liu
AU  - Liang Ye
PY  - 2016/07
DA  - 2016/07
TI  - Reliability Calculation of Product Failure Data (Part I: Theory)
BT  - Proceedings of the 2016 International Conference on Sensor Network and Computer Engineering
PB  - Atlantis Press
SP  - 197
EP  - 200
SN  - 2352-5401
UR  - https://doi.org/10.2991/icsnce-16.2016.39
DO  - 10.2991/icsnce-16.2016.39
ID  - Xia2016/07
ER  -