Development and Application of Metal Surface Analysis Methods

DOI

10.2991/icsmim-15.2016.26How to use a DOI?

Keywords

Metal surface analysis; Microscopic morphology analysis; Surface structure analysis; Surface elemental composition analysis; Depth analysis

Abstract

In recent years, metal surface analysis is becoming a hot topic, especially for the new composite materials used in high speed trains and aircraft. Metal surface analysis techniques are used to reveal the material surface morphology, structure, composition or state. This paper presents typical instruments and their application in various types of analytical methods, which includes microscopic surface topography analysis, surface structure analysis, composition analysis of the material surface and depth distribution analysis from surface to matrix. Scanning Electron Microscopy (SEM), X-Ray Diffraction (XRD), Scanning Tunneling Microscopy (STM), X-Ray Photoelectron Spectroscopy (XPS), Glow Discharge Spectrometer (GD-OES) and analysis images of metal surface are discussed.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Zhenzhen Wan
AU  - Yongqing Wang
AU  - Yingchang Zhou
PY  - 2016/01
DA  - 2016/01
TI  - Development and Application of Metal Surface Analysis Methods
BT  - Proceedings of the 2015 4th International Conference on Sensors, Measurement and Intelligent Materials
PB  - Atlantis Press
SP  - 134
EP  - 139
SN  - 2352-538X
UR  - https://doi.org/10.2991/icsmim-15.2016.26
DO  - 10.2991/icsmim-15.2016.26
ID  - Wan2016/01
ER  -