Proceedings of the 2nd International Conference On Systems Engineering and Modeling (ICSEM 2013)

Experiments and Evaluation Based Pixellated CZT Semiconductor Detector

Authors
Min Shen, Zhi-ling Tang
Corresponding Author
Min Shen
Available Online April 2013.
DOI
10.2991/icsem.2013.95How to use a DOI?
Keywords
Cadmium zinc telluride, semiconductor detector, Indium contacts, dark current
Abstract

Cadmium zinc telluride (CZT) material is one of the preferred materials for the fabrication of X-ray and gamma-ray detector. In this paper, it is presented an experimental detector system based on pixellated CZT semiconductor detector. At the same time, some research and design on the surface signal-readout method and the preamplifier circuitry is made. The signal coming from the CdZnTe material exposed to the radiation through the experiment is successfully required. The collection-efficiency between the electron and the hole in the anode is test when the different bias is applied in the pixellated CZT semiconductor detector. The parameter of the CZT detector and validate the responsive effect for the radiation is evaluated.The experiments and evaluation basis for the development of subsequent gamma spectrometer.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference On Systems Engineering and Modeling (ICSEM 2013)
Series
Advances in Intelligent Systems Research
Publication Date
April 2013
ISBN
978-94-91216-42-8
ISSN
1951-6851
DOI
10.2991/icsem.2013.95How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Min Shen
AU  - Zhi-ling Tang
PY  - 2013/04
DA  - 2013/04
TI  - Experiments and Evaluation Based Pixellated CZT Semiconductor Detector
BT  - Proceedings of the 2nd International Conference On Systems Engineering and Modeling (ICSEM 2013)
PB  - Atlantis Press
SP  - 490
EP  - 493
SN  - 1951-6851
UR  - https://doi.org/10.2991/icsem.2013.95
DO  - 10.2991/icsem.2013.95
ID  - Shen2013/04
ER  -