Proceedings of the 3rd International Conference on Management Science and Software Engineering (ICMSSE 2023)

Application of Minitab-based Six Sigma to improve Functional Circuit Test throughput rates

Authors
Jinjing Zhou1, *, Yinfen Zhao1
1Hangzhou Zhiyuan Electronics Co. Shanghai Youzhi Engineering Consulting Co., Shanghai, China
*Corresponding author. Email: zjeizjj@163.com
Corresponding Author
Jinjing Zhou
Available Online 9 October 2023.
DOI
10.2991/978-94-6463-262-0_35How to use a DOI?
Keywords
Six Sigma; Minitab; quality improvement; FCT straight-through rate
Abstract

With the increasing demand for quality from customers, it is an important way for companies to improve quality by studying Six Sigma management methods and applications. In this paper, Company Z uses Six Sigma theory combined with Minitab software to analyse problems through Six Sigma tools such as MSA, C&E matrix, FMEA, double sample T, regression analysis and engineering capability analysis to improve the one-time throughput rate of FCT (Functional Circuit Test) for T products as an application case [1]. It served as a case study and inspiration for the in-depth implementation of Six Sigma in Company Z. It also provides an example of improvement and experience for other companies implementing Six Sigma, with a view to contributing to the development of Six Sigma in Chinese enterprises.

Copyright
© 2024 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

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Volume Title
Proceedings of the 3rd International Conference on Management Science and Software Engineering (ICMSSE 2023)
Series
Atlantis Highlights in Engineering
Publication Date
9 October 2023
ISBN
978-94-6463-262-0
ISSN
2589-4943
DOI
10.2991/978-94-6463-262-0_35How to use a DOI?
Copyright
© 2024 The Author(s)
Open Access
Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.

Cite this article

TY  - CONF
AU  - Jinjing Zhou
AU  - Yinfen Zhao
PY  - 2023
DA  - 2023/10/09
TI  - Application of Minitab-based Six Sigma to improve Functional Circuit Test throughput rates
BT  - Proceedings of the 3rd International Conference on Management Science and Software Engineering (ICMSSE 2023)
PB  - Atlantis Press
SP  - 311
EP  - 317
SN  - 2589-4943
UR  - https://doi.org/10.2991/978-94-6463-262-0_35
DO  - 10.2991/978-94-6463-262-0_35
ID  - Zhou2023
ER  -