Research on ICFD Deep Test Technology Based on LabVIEW Applied to Nuclear Power Station Circuit Board
Authors
Liangcai Qi, Jishi Guan, Xincai Chang
Corresponding Author
Liangcai Qi
Available Online April 2017.
- DOI
- 10.2991/icmse-17.2017.70How to use a DOI?
- Keywords
- Nuclear Power Station, ICFD, LabVIEW, Fault diagnosis
- Abstract
This paper introduces a ICFD (In-Circuit Fault Dignosis) deep test method. According to making test plan of the partial functional module of circuit board, gathering the input and output in-circuit, and assess the performance of the board. This method improves the ICFD technology while it can only test components before. The paper demonstrates the test result of Nuclear Power Station(NPS) board.
- Copyright
- © 2017, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Liangcai Qi AU - Jishi Guan AU - Xincai Chang PY - 2017/04 DA - 2017/04 TI - Research on ICFD Deep Test Technology Based on LabVIEW Applied to Nuclear Power Station Circuit Board BT - Proceedings of the 2017 7th International Conference on Manufacturing Science and Engineering (ICMSE 2017) PB - Atlantis Press SP - 372 EP - 374 SN - 2352-5401 UR - https://doi.org/10.2991/icmse-17.2017.70 DO - 10.2991/icmse-17.2017.70 ID - Qi2017/04 ER -