Effect of the Substrate Distance on the Microstructure and Properties of SnBi-?Al2O3 Joint Welded by Ultrasonic-assisted Brazing
- DOI
- 10.2991/icmmita-15.2015.211How to use a DOI?
- Keywords
- SnBi-?Al2O3; substrate distance; ultrasonic-assisted brazing; microstructure
- Abstract
New ultrasonic-assisted brazing technology was adopted to weld mini butt joint by SnBi composite solder with 1.5wt% Al2O3 content and 0.5mm, 0.8mm and 1mm three kinds of copper substrate distance. The mechanical properties of the mini butt joint were characterized by means of the micro hardness tester and home-made micro mechanical test system. The microstructure of the samples were observed by scanning electron microscope, and the composition of intermetallic compounds was detected by the energy disperse spectroscopy. The results showed that the ultrasonic-assisted brazing method could promote the expansion of liquid solder on the substrate, improve the wettability, and full of the weld. With the increase of the substrate distance, the alloy microstructure refined, the IMC zone at the interface gradually had a tendency to grow thin, and improved the reliability of the solder joint. Near the composite solder was IMC Cu6Sn5, and the copper substrate was IMC Cu3Sn. Appropriate increase for the substrate distance will contribute to the micro hardness increase.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Ning Zhang AU - Haobin Shao AU - Xiaodong Shi AU - Chunhong Zhang PY - 2015/11 DA - 2015/11 TI - Effect of the Substrate Distance on the Microstructure and Properties of SnBi-?Al2O3 Joint Welded by Ultrasonic-assisted Brazing BT - Proceedings of the 2015 3rd International Conference on Machinery, Materials and Information Technology Applications PB - Atlantis Press SP - 1149 EP - 1153 SN - 2352-538X UR - https://doi.org/10.2991/icmmita-15.2015.211 DO - 10.2991/icmmita-15.2015.211 ID - Zhang2015/11 ER -