Test Configuration for Incipient Fault Detection
- DOI
- 10.2991/icence-16.2016.86How to use a DOI?
- Keywords
- Equipment Health Management; Design for Testability; Test Optimization Configuration; Generic Algorithm
- Abstract
Information sensing and test are premise and foundation of (Equipment Health Management, EHM), a reasonable sensor configuration not only provide accurate and complete fault information, but also improve fault diagnostics, fault prognostics and health state evaluation capability. To address the problem that the traditional test selection and optimization are mainly for fault detection and isolation, then, testability indices for EHM are firstly formulated quantitatively, then, test optimization selection model which minimizes test cost is modeled, and the generic algorithm is introduced to solve the problem. At last, a simulation case and an application case are given to verify & validate the proposed model and method.
- Copyright
- © 2016, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - Shuming Yang AU - Xiaoyu Wen AU - Xiaofei Zhang PY - 2016/09 DA - 2016/09 TI - Test Configuration for Incipient Fault Detection BT - Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016) PB - Atlantis Press SP - 454 EP - 458 SN - 2352-538X UR - https://doi.org/10.2991/icence-16.2016.86 DO - 10.2991/icence-16.2016.86 ID - Yang2016/09 ER -