The Identification of the Characteristic of Running-in Surface Based on Wavelet and Fractal Dimension

DOI

10.2991/icence-16.2016.81How to use a DOI?

Keywords

Image; Identification; Surface; Discrete Wavelet Transform; Fractal Box dimension; Running-in

Abstract

The experiment of running-in was carried out on the pin-disk test machine. Then the images of surface topography were taken by OLYMPUS optical digital microscope. In order to identify these images, the arithmetic of discrete wavelet transform(DWT) and fractal box dimension which used to describe the images were produced. Thus, the qualitative and quantitative description for the image characteristic of surface topography were realized. The study indicated that the DWT method can descomposed more details and be beneficial to analyze the image. Moreover the fractal box dimensions of surface topography are identical with the roughness of running-in surface in the rule. At the last, the conclusion can be acquired that the box dimension is capable of acting an characteristic parameter to evaluate the level of running-in surface.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Qi Han
AU  - Zhenguo Jing
PY  - 2016/09
DA  - 2016/09
TI  - The Identification of the Characteristic of Running-in Surface Based on Wavelet and Fractal Dimension
BT  - Proceedings of the 2nd International Conference on Electronics, Network and Computer Engineering (ICENCE 2016)
PB  - Atlantis Press
SP  - 423
EP  - 427
SN  - 2352-538X
UR  - https://doi.org/10.2991/icence-16.2016.81
DO  - 10.2991/icence-16.2016.81
ID  - Han2016/09
ER  -