Research on Low Ambient Short-circuit Test and X-Ray Inspection for Inner Damage of Single Encapsulation Dual Winding Reactor Models

DOI

10.2991/iceep-16.2016.74How to use a DOI?

Keywords

dry-type reactor, low ambient short circuit destroy test, inner damage, X-ray inspection

Abstract

Low ambient temperature destroys of dry-type air ore reactors often occurred in recent years. In this paper, single encapsulation dual winding reactor models have been prepared. X-Ray inspection has been performed for inner damage examination after destroy by short-circuit under low- ambient electrifying. A new evaluation method has been proposed for the inner defect examination of dry type reactors.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Haoyang Du
AU  - Ming Ao
AU  - Dongyun Shi
AU  - Chunming Zhao
AU  - Shijiu Wang
AU  - Zhongjin Xiao
PY  - 2016/11
DA  - 2016/11
TI  - Research on Low Ambient Short-circuit Test and X-Ray Inspection for Inner Damage of Single Encapsulation Dual Winding Reactor Models
BT  - Proceedings of the 2016 5th International Conference on Energy and Environmental Protection (ICEEP 2016)
PB  - Atlantis Press
SP  - 441
EP  - 444
SN  - 2352-5401
UR  - https://doi.org/10.2991/iceep-16.2016.74
DO  - 10.2991/iceep-16.2016.74
ID  - Du2016/11
ER  -