Research on Reconfigurable Instruments Based on FPGA

DOI

10.2991/iceeecs-16.2016.132How to use a DOI?

Keywords

FPGA, Nios II, reconfigurable instruments, PXI.

Abstract

It is incidental for current automatic test system (ATS) to lead short of circuits, damage of instruments or units under test (UUT) by reason of its large amount of switches. To solve the problem, the technique of reconfigurable instrument is introduced. Using the reconfigurable instruments as substitutes for variety of single function instruments, the ATS reduces the number of switches, cuts down the redundancy of instruments and interfaces, improves reliability. By employing AP configuration mode, a FPGA partial reconfiguration scheme based on FLASH + SD card is introduced in this paper. The FPGA reconfiguration technology is analyzed and corresponding configuration SOPC system is designed. The reconfigurable instrument functions are realized combining the reconfigurable FPGA and universal peripheral circuits.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Shaohui Cui
AU  - Mingze Gou
AU  - Jin Luo
PY  - 2016/12
DA  - 2016/12
TI  - Research on Reconfigurable Instruments Based on FPGA
BT  - Proceedings of the 2016 4th International Conference on Electrical & Electronics Engineering and Computer Science (ICEEECS 2016)
PB  - Atlantis Press
SP  - 669
EP  - 673
SN  - 2352-538X
UR  - https://doi.org/10.2991/iceeecs-16.2016.132
DO  - 10.2991/iceeecs-16.2016.132
ID  - Cui2016/12
ER  -