Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics

A novel method for Measuring Mass by Image Processing

Authors
Xiaomin Tan, Jintian Lei, Hongmei Bi, Tianpeng Liu, Xuejun Zhang, Ximing Wang
Corresponding Author
Xiaomin Tan
Available Online June 2015.
DOI
10.2991/icecee-15.2015.170How to use a DOI?
Keywords
Thin Plate Spline (TPS) Fast Fourier Transform (FFT) Mass Spectrum Bending Energy Computer Vision
Abstract

Image processing in terms of grid deformation was applied to measure the mass of objects. In spatial domain, Thin Plate Spline (TPS) method was employed to provide the value of minimum bending energy produced during grid deformation, and quantized mass of object; in frequency domain, Fast Fourier Transform (FFT) algorithm was to calculate the changed value of spectrum both before and after deformation in a power spectrum region. After drawing the relation curve between spatial/frequency feature and corresponding mass, mass of unknown objects can be measured on images before and after deformation. Results showed that, as the acting force that objects withstood became larger, values of bending energy increased, effects for spectrum spreading became more obvious as well. Objects having good flexibilities were compared and analyzed through an image experiment and it showed that tensile belt fitted the experiment pretty well. Different values of acting force were applied to the belt and its deformation effect was remarkable. The result was linear distribution and in accordance with the theoretical expectation.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
Series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
978-94-62520-81-3
ISSN
2352-538X
DOI
10.2991/icecee-15.2015.170How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xiaomin Tan
AU  - Jintian Lei
AU  - Hongmei Bi
AU  - Tianpeng Liu
AU  - Xuejun Zhang
AU  - Ximing Wang
PY  - 2015/06
DA  - 2015/06
TI  - A novel method for Measuring Mass by Image Processing
BT  - Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
PB  - Atlantis Press
SP  - 888
EP  - 893
SN  - 2352-538X
UR  - https://doi.org/10.2991/icecee-15.2015.170
DO  - 10.2991/icecee-15.2015.170
ID  - Tan2015/06
ER  -