Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics

Random Finite Element Computation Analysis of Deformation of Multi-pivot Foundation Pit

Authors
Ming Yang, Jun Wang, Zhengxiang Wang, Chaofeng Wu
Corresponding Author
Ming Yang
Available Online June 2015.
DOI
10.2991/icecee-15.2015.35How to use a DOI?
Keywords
Multi-support; Foundation pit; Finite element.
Abstract

The paper selects shear strength index of soil as the random variable, and applies elastic foundation beam system finite element method and load incremental method to establish random finite element computing model of multi-pivot piling wall supporting foundation pit deformation and deduct the partial derivative of foundation pit deformation for random variable. Combined with the improved the first-order second-moment method, the paper analyzes the reliability of multi-pivot piling wall supporting foundation pit deformation for providing theoretical and research basis for the design method of deep excavation engineering based on reliability theory.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
Series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
978-94-62520-81-3
ISSN
2352-538X
DOI
10.2991/icecee-15.2015.35How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Ming Yang
AU  - Jun Wang
AU  - Zhengxiang Wang
AU  - Chaofeng Wu
PY  - 2015/06
DA  - 2015/06
TI  - Random Finite Element Computation Analysis of Deformation of Multi-pivot Foundation Pit
BT  - Proceedings of the 2015 International Conference on Electrical, Computer Engineering and Electronics
PB  - Atlantis Press
SP  - 149
EP  - 158
SN  - 2352-538X
UR  - https://doi.org/10.2991/icecee-15.2015.35
DO  - 10.2991/icecee-15.2015.35
ID  - Yang2015/06
ER  -