Research on the DFT for Mixed-Signal Circuits

DOI

10.2991/iccsee.2013.160How to use a DOI?

Keywords

fault detection,DFT,JTAG, Mixed-Signal Circuits.

Abstract

Nowadays with the increases of the density of large scale integrated circuits, researches of Design for Test (DFT) become more and more important. JTAG (JTAG: Joint Test Action Group, also called Boundary Scan) has been widely used in test area, which improves the testability and reliability of mixed-signal circuits. This paper puts forward a scheme to design a test System based on boundary scan technology. The system is realized in an electronic control system, which is composed of mixed-signal circuits. With this method, several test experiments are carried out in the system, which include infrastructure integrity test, interconnect test, cluster test, AD/DA test and so on. The results of experiments show that the system based on JTAG can work normally, which is able to promote the testability of system efficaciously. In a word, the capability of DFT is viable and the system is a virtual tool in the process of DFT design and application.

Copyright

© 2013, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Guo-gang Lioa
AU  - Jun Li
AU  - Chun-yan Chen
PY  - 2013/03
DA  - 2013/03
TI  - Research on the DFT for Mixed-Signal Circuits
BT  - Proceedings of the 2nd International Conference on Computer Science and Electronics Engineering (ICCSEE 2013)
PB  - Atlantis Press
SP  - 630
EP  - 632
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccsee.2013.160
DO  - 10.2991/iccsee.2013.160
ID  - Lioa2013/03
ER  -