Integration Challenges and Opportunities for Gate-All-Around FET (GAA FET) in Next-Generation Electronic Devices
- DOI
- 10.2991/978-94-6463-471-6_131How to use a DOI?
- Keywords
- GAA FET; integration challenges; next-generation electronics; semiconductor technology
- Abstract
In the rapidly advancing landscape of semiconductor technology, Gate-All-Around FET (GAA FET) stands as a promising innovation poised to redefine the capabilities of next-generation electronic devices. This paper investigates the integration challenges and potential opportunities associated with the widespread adoption of GAA FET technology. Beginning with an overview of traditional transistor limitations, we delve into the fundamentals of GAA FET structures, emphasizing their operational advantages. The analysis highlights critical integration hurdles, encompassing fabrication complexities, scalability issues, material compatibility constraints, and manufacturing intricacies. Furthermore, this paper explores innovative strategies and solutions aimed at addressing these challenges, offering insights into the transformative impact of successful GAA FET integration on the performance, efficiency, and applications of future electronic devices. Ultimately, this study underscores the significance of resolving integration obstacles to unlock the full potential of GAA FETs in driving the evolution of electronic devices.
- Copyright
- © 2024 The Author(s)
- Open Access
- Open Access This chapter is licensed under the terms of the Creative Commons Attribution-NonCommercial 4.0 International License (http://creativecommons.org/licenses/by-nc/4.0/), which permits any noncommercial use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license and indicate if changes were made.
Cite this article
TY - CONF AU - Jami Venkata Suman AU - A. Swetha Priya AU - G. M. Anitha Priyadarshini AU - K. Krishnamraju AU - Akurathi Gangadhar AU - Mamidipaka Hema PY - 2024 DA - 2024/07/30 TI - Integration Challenges and Opportunities for Gate-All-Around FET (GAA FET) in Next-Generation Electronic Devices BT - Proceedings of the International Conference on Computational Innovations and Emerging Trends (ICCIET- 2024) PB - Atlantis Press SP - 1361 EP - 1368 SN - 2352-538X UR - https://doi.org/10.2991/978-94-6463-471-6_131 DO - 10.2991/978-94-6463-471-6_131 ID - Suman2024 ER -