Test Frequency Selection of Analog Circuit Based on Discrete Particle Swarm Algorithm

DOI

10.2991/iccasm.2012.156How to use a DOI?

Keywords

Test frequency selection,Discrete particle swarm algorithm, Analog circuit, Fitness function

Abstract

A method of optimal test frequency selection for analog circuit fault diagnosis is proposed. The method simulates the circuit faulty states only in the bands with highest fault sensitivity and that reduces part of simulation cost. Test frequency selection is considered as a multi-objective optimization problem, discrete particle swarm algorithm is used as a new approach to get optimal test frequency sets. An example shows that the proposed method is effective in frequency selection and works more efficiently compared with genetic algorithm.

Copyright

© 2012, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Zhigang Zheng
AU  - Liang Wu
PY  - 2012/08
DA  - 2012/08
TI  - Test Frequency Selection of Analog Circuit Based on Discrete Particle Swarm Algorithm
BT  - Proceedings of the 2012 International Conference on Computer Application and System Modeling (ICCASM 2012)
PB  - Atlantis Press
SP  - 615
EP  - 618
SN  - 1951-6851
UR  - https://doi.org/10.2991/iccasm.2012.156
DO  - 10.2991/iccasm.2012.156
ID  - Zheng2012/08
ER  -