Proceedings of the 2016 6th International Conference on Applied Science, Engineering and Technology

Research on the Electronic Circuits Reliability Tolerance Analysis Method and Its Application

Authors
Yonghong Fan, Na Li, Jianguo Zhang
Corresponding Author
Yonghong Fan
Available Online May 2016.
DOI
10.2991/icaset-16.2016.11How to use a DOI?
Keywords
Electronic Circuits, Reliability, Tolerance Analysis Method
Abstract

In the electronic circuit system design process, tolerance analysis is the basis for reliability design. And it is also the most advanced design technology representing an important development direction in this field currently. In this paper, electronic circuits reliability tolerance analysis method was studied in process of electronic circuit system design, and also the application of the design was discussed. The study shows that tolerance analysis and fault diagnosis is a set of scientific and modern theory and technology and could be widely used in electronic circuit system design and reliability tolerance analysis.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 6th International Conference on Applied Science, Engineering and Technology
Series
Advances in Engineering Research
Publication Date
May 2016
ISBN
978-94-6252-186-5
ISSN
2352-5401
DOI
10.2991/icaset-16.2016.11How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yonghong Fan
AU  - Na Li
AU  - Jianguo Zhang
PY  - 2016/05
DA  - 2016/05
TI  - Research on the Electronic Circuits Reliability Tolerance Analysis Method and Its Application
BT  - Proceedings of the 2016 6th International Conference on Applied Science, Engineering and Technology
PB  - Atlantis Press
SP  - 60
EP  - 63
SN  - 2352-5401
UR  - https://doi.org/10.2991/icaset-16.2016.11
DO  - 10.2991/icaset-16.2016.11
ID  - Fan2016/05
ER  -