Proceedings of the 2016 5th International Conference on Advanced Materials and Computer Science

Distribution Network Reliability Assessment Based on User Response

Authors
Xi Chen
Corresponding Author
Xi Chen
Available Online June 2016.
DOI
10.2991/icamcs-16.2016.92How to use a DOI?
Keywords
demand response, TOU price, price elasticity coefficient, load curve construction, curve clustering, reliability evaluation
Abstract

Demand response can guide the demand side changing power mode, to achieve the purpose of peak load shifting, and load curve changes will inevitably affect the system's reliability. Taking the TOU price as an example, we discuss quantitatively the effects of demand response on power supply reliability of distribution network. Firstly, with the price elasticity coefficient in economics, contact is established between the load curve and price. Secondly, considering the different industry, the load curve were evaluated respectively after the implementation of TOU price. Thirdly, obtain the total load curve. Finally, using curve clustering method to analyze the load curve. Combined with the examples show that the demand response can effectively improve the phenomenon of peak valley load curve, and improve the reliability of distribution network.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 5th International Conference on Advanced Materials and Computer Science
Series
Advances in Engineering Research
Publication Date
June 2016
ISBN
978-94-6252-189-6
ISSN
2352-5401
DOI
10.2991/icamcs-16.2016.92How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xi Chen
PY  - 2016/06
DA  - 2016/06
TI  - Distribution Network Reliability Assessment Based on User Response
BT  - Proceedings of the 2016 5th International Conference on Advanced Materials and Computer Science
PB  - Atlantis Press
SP  - 438
EP  - 442
SN  - 2352-5401
UR  - https://doi.org/10.2991/icamcs-16.2016.92
DO  - 10.2991/icamcs-16.2016.92
ID  - Chen2016/06
ER  -