Correlation Between Indicators of the Electronic Testing And the Current Test for Raw Silk

DOI

10.2991/icadme-17.2017.30How to use a DOI?

Keywords

Raw Silk, Electronic Testing, Seriplane Test, Correlation Coefficient.

Abstract

Five batches of raw silk were tested in the electronic testing for raw silk on the raw silk electronic detector, meanwhile, the current test of raw silk was done in accordance with GB/T 1797-2008 standard for raw silk, and the correlation between indicators of the electronic testing and the current test of raw silk were analyzed by using DPS data processing software. The results showed that there were stronger correlation between the coefficient of variation of the raw silk size CVeven and CV5m and the thick and thin defects as well as the medium rough in the electronic testing for raw silk; the coefficient of variation of the raw silk size and the thick and thin defects in the electronic testing for raw silk has stronger positive correlation with the evenness change 2nd degree numbers but stronger negative correlation with neatness in the seriplane test; the neatness and evenness in the seriplane test are the comprehensive reflection of all kinds of indicators in the electronic testing for raw silk.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Jiantao Niu
AU  - Qi Hu
AU  - Jianmei Xu
PY  - 2017/07
DA  - 2017/07
TI  - Correlation Between Indicators of the Electronic Testing And the Current Test for Raw Silk
BT  - Proceedings of the 2017 7th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2017)
PB  - Atlantis Press
SP  - 153
EP  - 157
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-17.2017.30
DO  - 10.2991/icadme-17.2017.30
ID  - Niu2017/07
ER  -