Research on Interval Pulse IV Test Method for Power Semiconductor Devices

DOI

10.2991/icadme-16.2016.129How to use a DOI?

Keywords

Interval pulse IV test method, verification system, standard protocol.

Abstract

This paper did carefully research on the principle of point test method for semiconductor devices testing, and pulse step current source and voltage source was developed. Verification system of the interval pulse IV test method was developed to identify the relationship of the pulse width and interval time of Interval pulse IV test method. The specification of this system is vivificated through evaluating the uncertainties of the system. Then standard protocol of the interval pulse IV test method for power semiconductor devices is fulfilled.

Copyright

© 2016, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Chong Liu
AU  - Jie Li
AU  - Jinsong Kan
PY  - 2017/07
DA  - 2017/07
TI  - Research on Interval Pulse IV Test Method for Power Semiconductor Devices
BT  - Proceedings of the 2016 6th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2017)
PB  - Atlantis Press
SP  - 720
EP  - 724
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-16.2016.129
DO  - 10.2991/icadme-16.2016.129
ID  - Liu2017/07
ER  -