Proceedings of the 2016 6th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2017)

TMR-Based Soft Error Tolerance Techniques in ASIC Design

Authors
Xin He, Xu Huang, Yujing Li
Corresponding Author
Xin He
Available Online July 2017.
DOI
10.2991/icadme-16.2016.76How to use a DOI?
Keywords
TMR; Soft Error; SEU; ASIC.
Abstract

With the evolution of process and innovation of design technology, it makes soft errors on the reliability of the integrated circuit to bring more and more serious threat. Space radiation environment caused by high-energy particles Single Event Upset (SEU) event seriously affected the reliability of the integrated circuit. On the basis of the process level and layout-level and other complex soft error tolerance techniques, a redundant structure can achieve shielding effect of Single Event Upset. Triple modular redundant structure is easy to implement, also makes the anti-radiation performance of the entire circuit has been greatly improved.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 6th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2017)
Series
Advances in Engineering Research
Publication Date
July 2017
ISBN
978-94-6252-249-7
ISSN
2352-5401
DOI
10.2991/icadme-16.2016.76How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Xin He
AU  - Xu Huang
AU  - Yujing Li
PY  - 2017/07
DA  - 2017/07
TI  - TMR-Based Soft Error Tolerance Techniques in ASIC Design
BT  - Proceedings of the 2016 6th International Conference on Advanced Design and Manufacturing Engineering (ICADME 2017)
PB  - Atlantis Press
SP  - 455
EP  - 458
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-16.2016.76
DO  - 10.2991/icadme-16.2016.76
ID  - He2017/07
ER  -