The reflection coefficients of multilayer anti-counterfeiting optical films for S-polarized wave

DOI

10.2991/icadme-15.2015.227How to use a DOI?

Keywords

Multilayer anti-counterfeiting optical film, reflection coefficients of light, S-polarized wave

Abstract

Considering the difference of phase-shift direction and amplitude attenuation direction when the optical wave propagates in conductive medium, with the boundary conditions of optical wave at the interface of the media, we derive the recurrence formula reflection coefficient for the S-polarized optical wave in the multilayer film. Given a calculating example for multilayer anti-counterfeiting optical films, the result shows that thickness of metal film has important effect on the reflection coefficient of light, and the multilayer film has stronger reflection effective of narrow band.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Yannan Hao
AU  - Fuping Liu
AU  - Yue Xu
AU  - Anling Wang
PY  - 2015/10
DA  - 2015/10
TI  - The reflection coefficients of multilayer anti-counterfeiting optical films for S-polarized wave
BT  - Proceedings of the 5th International Conference on Advanced Design and Manufacturing Engineering
PB  - Atlantis Press
SP  - 1236
EP  - 1239
SN  - 2352-5401
UR  - https://doi.org/10.2991/icadme-15.2015.227
DO  - 10.2991/icadme-15.2015.227
ID  - Hao2015/10
ER  -