A Nondestructive Method for Measurements of Complex Permittivity of Microwave Dielectric Substrate Materials

DOI

10.2991/ic3me-15.2015.187How to use a DOI?

Keywords

dielectric substrates, microwave measurement, permittivity measurement, nondestructive testing, cavity resonator.

Abstract

A nondestructive and accurate measurement method and related apparatus based on the split-cylinder resonator techniques is descried in this paper. The dielectric constants and loss tangents of the flat substrate materials are suitable to be characterized and then calculated by software programmed according to a rigorous mode match analysis of the TE011 mode. The dielectric properties of some typical substrate materials have been measured, and measurement uncertainties are also given in this paper. In addition, the effect of sample thickness on the dielectric properties is also investigated. These results demonstrate that this technology is capable of accurately characterizing the dielectric properties of flat substrate materials versus frequency by changing the sample thickness.

Copyright

© 2015, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Fei Zhao
AU  - Pei Xu
AU  - Changtao Sha
AU  - Wenfeng Wang
AU  - Jinsong Kan
PY  - 2015/08
DA  - 2015/08
TI  - A Nondestructive Method for Measurements of Complex Permittivity of Microwave Dielectric Substrate Materials
BT  - Proceedings of the 3rd International Conference on Material, Mechanical and Manufacturing Engineering
PB  - Atlantis Press
SP  - 968
EP  - 971
SN  - 2352-5401
UR  - https://doi.org/10.2991/ic3me-15.2015.187
DO  - 10.2991/ic3me-15.2015.187
ID  - Zhao2015/08
ER  -