Proceedings of the 2015 International Conference on Electronic Science and Automation Control

Optimum Bayesian Detection Based Interleaving Iteration Technology for Adjacent Cell Interference Mitigation

Authors
Guojun Ouyang, Ye Qian
Corresponding Author
Guojun Ouyang
Available Online August 2015.
DOI
10.2991/esac-15.2015.57How to use a DOI?
Keywords
Adjacent cell interference, Optimal bayesian detection, IDMA, OFDM
Abstract

In the communication of TD-LTE system, increase in frequency resource utilization to improve the system carrying capacity at the same time, resulting in the distance between the cells with the same frequency decreases with increasing from adjacent cells with the same channel interference. This article mainly aims at the fourth generation mobile communication system (TD - LTE) adjacent cell interference suppression and the OFDM - IDMA - OB (Optimum Bayesian Detection) multiuser joint Detection algorithm helps to improve the anti-interference ability of cell edge users. The performance improvement of the system is verified by using MATLAB to carry out bit error rate simulation.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2015 International Conference on Electronic Science and Automation Control
Series
Advances in Computer Science Research
Publication Date
August 2015
ISBN
978-94-62520-95-0
ISSN
2352-538X
DOI
10.2991/esac-15.2015.57How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Guojun Ouyang
AU  - Ye Qian
PY  - 2015/08
DA  - 2015/08
TI  - Optimum Bayesian Detection Based Interleaving Iteration Technology for Adjacent Cell Interference Mitigation
BT  - Proceedings of the 2015 International Conference on Electronic Science and Automation Control
PB  - Atlantis Press
SP  - 230
EP  - 233
SN  - 2352-538X
UR  - https://doi.org/10.2991/esac-15.2015.57
DO  - 10.2991/esac-15.2015.57
ID  - Ouyang2015/08
ER  -